IMEKO TC6 M4Dconf
19. – 21. September 2022
Hybrid with physical attendance in Berlin, Germany
IMEKO TC6: First International Conference on Metrology and Digital Transformation
M4Dconf 2022
On 19. - 21. September 2022 the IMEKO TC6 "Digitalization" organises the first international conference on metrology and digital transformation - the M4Dconf 2022. The Conference will be organized as hybrid event - with limited number of places for physical attendance in Berlin.
All sessions will provide video conferencing rooms for virtual attendees. Recordings of the presentations and sessions will also be available for participants to review until the end of December 2022.
Special Sessions
Pathways to digital transformation
There are 256 institutes currently participating in the CIPM MRA, and many more laboratories and regulatory bodies that will be affected by digital transformation of the international quality infrastructure. The needs, expertise, and resources of these various participants will vary greatly; a few are advanced along their digitalisation pathway, while many more feel daunted by the task ahead. However, unlike other sweeping technological changes in metrology, digital systems are ubiquitous. Institutes in all economies are facing the challenge of designing and implementing innovative solutions that are fit for the needs of particular communities and compatible with the emerging global standards. This session is intended for participants still in the early stages of transformation, or with needs that differ substantially from more advanced technological economies. It is a forum to share experience about novel and innovative approaches to digital transformation.
Modeling metrology in software for digital transformation
Society relies on sophisticated measurement infrastructures that use behind-the-scenes experts to generate, communicate, interpret, and consume data. Information technology now presents the challenge and opportunity to transform these apparently transparent infrastructures for the digital economy. Ideally, computing systems would generate, communicate, and consume the data without human intervention up and down the traceability chain and broadly across all measurement disciplines.
Digitalization of Metrology in Pharma Industry
The pharmaceutical industry as a whole (including the rapid development of new vaccines) is heavily regulated and competitive at the
same time. The regulatory issues and its high risk products make it often the leader among manufacturing industries in adopting new technologies
which then bring new regulations.
Sensor Network Metrology
Sensor networks are becoming a standard approach in many applications, ranging from regulated areas such as energy, water, gas and heat consumption (Legal Metrology) to low-cost Internet of Things (IoT) for Industry 4.0 (Industrial Metrology), even multi-sensor secondary realizations (fundamental metrology) and other areas such as healthcare, chemical and pharmaceutical industries.
Machine-readable Digital Calibration Certificates (DCC)
One of the first and highest priority step for the metrology community is recognized in the replacement of paper-based calibration certificates with their digital counterparts, Digital Calibration Certificates (DCCs). A DCC is not a simple digitalization of the paper-based certificate in the sense of an exact copy in electronic format like PDF or Word. DCCs provide the calibration data in fully machine-readable data structures in a way that a software can automatically read the data from a DCC without error-prone human transcription. DCCs potentially allowing automated and machine-aided approaches to be used throughout all parts of calibration and measurement processes are essential for many organisations on the road to full digital transformation. The adoption of DCCs will thus lead to increased efficiency within those processes.
EUROLAB - The lab of the future is now. How to embrace the present for a successful future?
Among the key priority areas of focus of EUROLAB for 2022 is list the “The Laboratory of the Future” and its development, including machine learning, digitalisation, cybersecurity, robotisation, AI, blockchain etc. It also implies new technologies such as 3D printing, robotics, high-tech devices or cloud computing; a paperless lab that focuses on reducing emissions, physical waste, optimising storage, energy and human resources. Also, the concept of “laboratory 4.0” revolutionizes the entire lab world, where Big Data, Cloud Computing, the Internet of Things, mobile Internet will play key roles in ensuring the upgrade of the laboratories. Therefore, the working environment of the laboratory is currently changing and re-adaptation of processes, services and work environment is absolutely needed for the labs to survive.
Scope
Digital representation and use of metrological information
Machine-readable certificates for metrological services
Cloud infrastructures, remote and digital service in the quality infrastructure
Metrology for industry 4.0
- digital representations of physical quantities and units of measurement
- digital representations of measurement error, uncertainty and models
- digital representation of measurement scale types and associated data
- computations with physical quantities
- information retrieval and knowledge representations (semantics, ontologies, etc.)
- digitalisation in legal metrology and the quality infrastructures
- metrology for the quality assessment and validation of algorithms and software
- digital calibration, conformity assessment, testing, and inspection certificates
- principles and technologies for remote monitoring, remote calibration, and remote conformity assessment
- digital infrastructures and technologies for interlaboratory comparisons and proficiency testing
- digital representation of metrological traceability
- metrological traceability in digital shadows, digital models and digital twins
- metrological traceability in the Internet of Things
- application of FAIR principles to measurement data (metadata, data quality, etc.) and the role of metrology for FAIR data
- decision making in autonomous digital measurement systems
- infrastructures for and application of machine learning and artificial intelligence
- metrology for industry 4.0
- digital sensor networks and systems metrology
- cybersecurity and network communication
- digital metrology for additive manufacturing
- augmented and virtual reality in metrological applications
Chair of Organizing Committee
Sascha Eichstädt
- Chair of IMEKO TC6
- Head of PTB Department "Metrology for digital transformation"
- ORCID 0000-0001-7433-583X
Chair of International Programme Committee
Daniel Hutzschenreuter
- Convener of CIPM Expert Group "SI Digital Framework"
- Specialist on "Metrology for data" in PTB Department "Metrology for digital transformation"
- ORCID 0000-0002-9095-0063
International Programme Committee
You can find the members of the International Programme Committee here.
- Chair of Organizing Committee
- Chair of International Programme Committee
- International Programme Committee
Important dates and deadlines
Deadline for submission of Special Sessions
End of call for Special Sessions
Deadline for abstract submissions
End of call for abstracts
Feedback to authors
Feedback from reviewers on submitted abstracts
Deadline for final papers
Submission of revised abstracts for publication and recorded video of presentation
Registration closes
Registration for physical attendance to the event closes
Begin of Conference M4Dconf2022
Closing of virtual conference plattform
Access to recorded videos closed
This conference is supported by
CIPM
The principal task of the International Committee for Weights and Measures (CIPM) is to promote world-wide uniformity in units of measurement and it does this by direct action or by submitting draft resolutions to the General Conference.
Duties of the CIPM include the responsibility to:
- discuss the work of the BIPM under the delegated authority of the CGPM;
- discuss metrological work that Member States decide to do in common, and set up and coordinate activities between specialists in metrology;
